Probing structures of nanomaterials using advanced electron microscopy methods, including aberration‐corrected electron microscopy at the angstrom scale
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| Description | scientific article published on October 15, 2010 |
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author: Pratibha Gai Mildred Dresselhaus |
| Publication date | October 15, 2010 |
| Language | English |
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| Access work |
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fjemt.20933 |
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