3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling.
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| Description | scientific article published on 20 January 2015 |
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author: James S. Sharp Morgan R. Alexander Alexander G Shard Ian S. Gilmore David J Scurr Rasmus Havelund |
| Publication date | January 20, 2015 |
| Language | English |
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