Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries
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| Description | scientific article published on 20 February 2017 |
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author: Juri Barthel Oana Cojocaru-Mirédin Christina Scheu Dierk Raabe Baptiste Gault |
| Publication date | February 20, 2017 |
| Language | English |
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