Multitrait, Random Regression, or Simple Repeatability Model in High-Throughput Phenotyping Data Improve Genomic Prediction for Wheat Grain Yield
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| Description | scientific article published on July 2017 |
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author: Jesse Poland Jean-Luc Jannink Mark E Sorrells Jessica Rutkoski |
| Publication date | July 1, 2017 |
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| Missing/wrong data? | Edit Wikidata item |