A look underneath the SiO2/4H-SiC interface after N2O thermal treatments
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| Description | scientific article published on April 8, 2013 |
| Author/s |
author: Fabrizio Roccaforte Filippo Giannazzo Patrick Fiorenza |
| Publication date | April 8, 2013 |
| Language | English |
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| Access work |
https://www.beilstein-journals.org/bjnano/content/pdf/2190-4286-4-26.pdf |
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| Missing/wrong data? | Edit Wikidata item |