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High-resolution genome-wide analysis of irradiated (UV and γ-rays) diploid yeast cells reveals a high frequency of genomic loss of heterozygosity (LOH) events
scientific article published on 20 January 2012
Author/s
author: Piotr A Mieczkowski, Ewa Malc
Work details
Publication date
January 20, 2012
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Language
English
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