3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profiling
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| Description | scientific article published on 7 June 2015 |
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author: Morgan R. Alexander Lee D Buttery Matthias Lütolf David J Scurr |
| Publication date | June 7, 2015 |
| Language | English |
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| Missing/wrong data? | Edit Wikidata item |