Missing/wrong data? Edit Wikidata item
Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III-V photonics platform on silicon using a laboratory X-ray diffraction setup
scientific article published on 31 May 2015
Author/s
Work details
Publication date:
May 31, 2015
Language:
English
Country of origin:
Unknown
Copyright status
Copyright status information is not available for this work. The copyright status depends on the jurisdiction, the author's date of death and the date the work was created or published.
To learn more about copyright terms in different countries, visit the countries and terms page.