Automated identification and classification of single particle serial femtosecond X-ray diffraction data.
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| Description | scientific article |
| Author/s |
author: Artem Rudenko Anton Barty Janos Hajdu Henry N. Chapman Benjamin Erk Andrew V Martin Johan Bielecki Max F Hantke Jakob Andreasson Andrew Aquila Daniel Rolles Lutz M Foucar Fenglin Wang Martin Svenda Benedikt Rudek Bianca Iwan Nicusor Timneanu Tomas Ekeberg |
| Publication date | February 1, 2014 |
| Language | English |
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