Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements
scientific article
Author/s
author: Ilme Schlichting, Veit Elser, Joachim Ullrich, Artem Rudenko, Heinz Graafsma, Sascha Epp, Benjamin Erk, Andrew V Martin, Michael J. Bogan, Henry N. Chapman, Uwe Weierstall, Richard Kirian, Lukas Lomb, Anton Barty, Thomas A White, Francesco Stellato, Nicusor Timneanu, John D. Bozek, Lutz M Foucar, Cornelia B Wunderer, Linda C Johansson, Joachim Schulz, Miriam Barthelmess, David Arnlund, Erik Malmerberg, Daniel P Deponte, Stefano Marchesini, Andrew Aquila, Robert Shoeman, Stephan Kassemeyer, Daniel Rolles, Benedikt Rudek, Nils Kimmel, Georg Weidenspointner, Mengning Liang, Lars Gumprecht, Tomas Ekeberg, Holger Fleckenstein, Helmut Hirsemann, Karol Nass, Heike Soltau, R Bruce Doak, Sasa Bajt, Carl Caleman, Ryan Coffee, Janos Hajdu, Marvin Seibert, Lothar Strüder, Petra Fromme, Richard Neutze, Thomas R M Barends, Raymond G Sierra, Jan Davidsson, Filipe R N C Maia, Günter Hauser, Jakob Andreasson, Christoph Bostedt, Stephan Stern, John Spence, Nicola Coppola, Christina Y Hampton, Mark Hunter
Work details
Copyright status
Copyright status information is not available for this work. The copyright status depends on the jurisdiction, the author's date of death and the date the work was created or published.
To learn more about copyright terms in different countries, visit the countries and terms page.