Study of radiation damage induced by 12 keV X-rays in MOS structures built on high-resistivityn-type silicon
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| Description | scientific article published on March 15, 2012 |
| Author/s |
author: Robert Klanner Ioana Pintilie |
| Publication date | March 15, 2012 |
| Language | English |
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| Access work |
http://journals.iucr.org/s/issues/2012/03/00/pp5012/pp5012.pdf |
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| Missing/wrong data? | Edit Wikidata item |