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Characterization of surface stiffness and probe–sample dissipation using the band excitation method of atomic force microscopy: a numerical analysis

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Description scientific article published on December 8, 2011
Author/s

author: Santiago D Solares 

Publication date December 8, 2011
Language English
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http://stacks.iop.org/0957-4484/23/i=1/a=015706/pdf

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