Note: Seesaw actuation of atomic force microscope probes for improved imaging bandwidth and displacement range.
| Image |  |
|---|---|
| Description | scientific article |
| Author/s |
author: Hamdi Torun David Torello |
| Publication date | August 1, 2011 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |