Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gun.
| Image |  |
|---|---|
| Description | scientific article |
| Author/s |
author: Yoshifumi Oshima Yasumasa Tanishiro Yoshiko Nakayama Kunio Takayanagi |
| Publication date | January 19, 2011 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |