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Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gun.
scientific article
Author/s
author: Yoshifumi Oshima, Yasumasa Tanishiro, Yoshiko Nakayama, Kunio Takayanagi
Work details
Publication date
January 19, 2011
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Language
English
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