Combined atomic force microscope-based topographical imaging and nanometer-scale resolved proximal probe thermal desorption/electrospray ionization-mass spectrometry
| Image |  |
|---|---|
| Description | scientific article |
| Author/s |
author: Gary J. Van Berkel Stephen Jesse |
| Publication date | June 6, 2011 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |