X-ray diffraction area mapping of preferred orientation and phase change in TiO2 thin films deposited by chemical vapor deposition
| Image |  |
|---|---|
| Description | scientific article |
| Author/s |
author: Geoffrey Hyett Ivan P. Parkin Mark A Green |
| Publication date | September 1, 2006 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |