"Depth-profiling" and quantitative characterization of the size, composition, shape, density, and morphology of fine particles with SPLAT, a single-particle mass spectrometer
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| Description | scientific article |
| Author/s |
author: Rahul A Zaveri |
| Publication date | January 4, 2008 |
| Language | English |
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| Missing/wrong data? | Edit Wikidata item |