Self-consistent iteration procedure in analyzing reflectivity and spectroscopic ellipsometry data of multilayered materials and their interfaces.
| Image |  |
|---|---|
| Description | scientific article |
| Author/s | |
| Publication date | December 1, 2014 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Access work | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |