FITS: Inferring Intermediate Taint Sources for Effective Vulnerability Analysis of IoT Device Firmware
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| Description | scientific article published on 07 February 2024 |
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author: Yaowen Zheng Dongliang Fang Puzhuo Liu Chengnian Sun Chuan Qin Limin Sun Mingdong Liu |
| Publication date | February 7, 2024 |
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