Study of edge effects in the breakdown process of p+ on n-bulk silicon diodes
| Image |  |
|---|---|
| Description | scholarly article |
| Author/s | |
| Publication date | January 2000 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Access work |
https://linkinghub.elsevier.com/retrieve/pii/S0168900299008748 |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |