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Validity and Uncertainty in RF-EMF Modelling of Base Station Exposure

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Description scholarly article
Author/s

author: Hans Kromhout  Johan Beekhuizen  Anke Huss 

Publication date October 20, 2014
Language English
Country of origin
Wikipedia link
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https://ehp.niehs.nih.gov/doi/10.1289/isee.2014.O-208

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