A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2 on SiO2
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| Description | scholarly article 10.1088/1361-6528/ACBE02 |
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author: Nathan Ullberg Benjamin Grévin Aloïs Arrighi Vincent Derycke |
| Publication date | February 22, 2023 |
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