Search filters

Residual Thermal Strain Distribution Measurement of Underfills in Flip Chip Electronic Packages by an Inverse Approach Based on the Sampling Moiré Method

Image Image of a generic work. The text above it indicates that there is no free image of the work available, and that if you own one, you can click on the placeholder link to upload it.
Description scientific article published in 2020
Author/s

author: Qinghua Wang 

Publication date January 15, 2020
Language
Country of origin
Wikipedia link
Copyright status
Missing/wrong data? Edit Wikidata item