Point defect detection and strain mapping in Si single crystal by two-dimensional multiplication moiré method
| Image |  |
|---|---|
| Description | scientific article published in 2021 |
| Author/s |
author: Qinghua Wang Peng Xia S Ri Nobuyuki Toyama Jiaxing Ye |
| Publication date | 2021 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |