Improved Measurement Accuracy for Junction-to-Case Thermal Resistance of GaN HEMT Packages by Gate-to-Gate Electrical Resistance and Stacking Thermal Interface Materials
| Image |  |
|---|---|
| Description | scientific article published in 2022 |
| Author/s |
author: Khai Ngo Cyril Buttay |
| Publication date | June 2022 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |