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Ultrafast dynamics of hot charge carriers in an oxide semiconductor probed by femtosecond spectroscopic ellipsometry

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Description scholarly article
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author: Rüdiger Schmidt-Grund  Mateusz Rebarz  Steffen Richter  Stefan Zollner  Joshua Leveillee  Jakob Andreasson  André Schleife  Shirly Espinoza  Marius Grundmann  Oliver Herrfurth 

Publication date August 25, 2020
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