Nondestructive measurements of depth distribution of carrier lifetimes in 4H-SiC thick epitaxial layers using time-resolved free carrier absorption with intersectional lights
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| Description | scientific article published on 01 December 2020 |
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author: Kazutoshi Kojima Tomohisa Kato Hajime Okumura Masashi Kato |
| Publication date | December 1, 2020 |
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